Single wafer residue, thin film removal and clean

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United States of America Patent

PATENT NO 6594847
SERIAL NO

09537913

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ATTORNEY / AGENT: (SPONSORED)

Importance

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Abstract

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A system is provided for use in semiconductor wafer cleaning operations. The cleaning system has a top cap and a bottom cap. The top cap seals on a top surface contact ring of a wafer, and the bottom cap seals on a bottom surface contact ring of the wafer. The wafer is held between the top cap and the bottom cap. An edge clean roller is used for cleaning an edge of the wafer. A drive roller is configured to rotate the wafer, the top cap, and the bottom cap. The edge clean roller rotates at a first velocity and the drive roller rotates at a second velocity so as to facilitate an edge cleaning of the wafer by the edge clean roller.

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Patent Owner(s)

Patent OwnerAddress
LAM RESEARCH CORPORATION4650 CUSHING PARKWAY FREMONT CA 94538

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
de, Larios John M Palo Alto, CA 72 1005
Krusell, Wilbur Palo Alto, CA 6 314
Ravkin, Mike Sunnyvale, CA 63 1167

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