Evaluation method, apparatus, and recording medium using optimum template pattern determination method, apparatus and optimum template pattern

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United States of America Patent

PATENT NO 6598019
SERIAL NO

09597269

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Abstract

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To improve the precision in correction of an input sentence by using a template pattern for model sentence. A plurality of template patterns for the model sentence are provided beforehand. Each of the template patterns is regarded as a plurality of templates of words/phrases based on expertise of language teachers with scores assigned to the words according to their importance. The scores and subsequently the input sentence are read and analyzed in comparison with each of the template patterns and the total of scores of matching words is calculated. A template pattern having the highest total score is selected as an optimum template pattern and the input sentence is corrected using the optimum template pattern. This method improves the likelihood that a template pattern containing a larger number of important words is selected as the optimum template pattern.

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Patent Owner(s)

Patent OwnerAddress
SUNFLARE CO LTDTOKYO JAPAN TOKYO METROPOLIS

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Sasai, Hiroyuki Fussa, JP 70 2153
Tokuda, Naoyuki Kokubunji, JP 10 677

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