Method and apparatus for diagnosing difficult to diagnose faults in a complex system
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United States of America Patent
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Sep 2, 2003
Grant Date -
N/A
app pub date -
Jul 3, 2000
filing date -
Oct 28, 1999
priority date (Note) -
In Force
status (Latency Note)
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Abstract
A method and apparatus for determining the root cause of no trouble found events in a machine is disclosed. The actual faults occurring during a predetermined time interval prior to the no trouble found event are analyzed and correlated with the no trouble found events in an effort to identify those actual faults that have a high correlation with each no trouble found event. If a high correlation is not found, then the no trouble found event is analyzed off-line to determine the root cause.
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