Thickness-measuring device
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United States of America Patent
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-
Sep 9, 2003
Grant Date -
Oct 3, 2002
app pub date -
Feb 25, 2002
filing date -
Apr 3, 2001
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A thickness-measuring device comprising (i) an X-ray tube unit including an X-ray tube, (ii) an X-ray detector unit including an X-ray detector having a sensor, and (iii) a means for driving the X-ray tube unit and the X-ray detector unit back and forth, in synchronism with each other, widthwise of an object whose thickness is measured and which runs through a pathline between the X-ray tube unit and the X-ray detector unit. A mask is set above the sensor of the X-ray detector to cover it partly; accordingly, the light-receiving area of the light receiver of the X-ray detector is smaller than the whole area of the sensor. Thus, the measuring area per unit time is reduced effectively.
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