Quality surveillance of a production process

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United States of America Patent

PATENT NO 6622101
SERIAL NO

09868922

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Abstract

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Method for monitoring a quality of a plurality of particularly different technical product types which are produced in a quasi-parallel manufacturing process, the manufacturing method including several sequentially arranged manufacturing stations, and whereby a course of a state variable for at least one of the manufacturing stations is determined point-by-point and displayed, the method including determining as a first type number a number of product types to be monitored, determining technical product parameter which is affected in the at least one manufacturing station, allocating a measuring arrangement to the manufacturing station for measuring the technical product parameter for at least one of the monitored product types, taking a random sample of a product type whose physical state is modified in the manufacturing station, the random sample being taken the first type number of product types, determining measured values for the determined technical product parameter of the random sample, calculating an individual average value from the measured values, storing the individual average value in a multi-dimensional average value attributed to the first type number, and repeating the taking through the storing for at least one further product type to supplement at least one further measured average value to the multi-dimensional average value.

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Patent Owner(s)

Patent OwnerAddress
FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E VHANSASTRASSE 27C MUNICH 80686
X-FAB SEMICONDUCTOR FOUNDRIES AGERFURT GERMANY AERZEN LOWER SAXONY

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hennig, Peter Vieselbach, DE 1 13
Oechsner, Richard Nuremberg, DE 1 13
Pfitzner, Lothar Erlangen, DE 10 173
Schneider, Claus Bubenreuth, DE 63 383
Strzyzewski, Poitr Herzogenrath, DE 1 13
Tschaftary, Thomas Fuerth, DE 2 22

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