Method and apparatus for identifying and correcting line artifacts in a solid state X-ray detector
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United States of America Patent
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Sep 23, 2003
Grant Date -
Mar 6, 2003
app pub date -
Aug 28, 2001
filing date -
Aug 28, 2001
priority date (Note) -
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Abstract
A method is provided for identifying detector elements in a solid state X-ray detector susceptible to causing line artifacts due to faulty detector elements that leak charge. A portion of the X-ray detector is covered by a radiation occluding material and the detector is exposed to a level of radiation sufficient to reach a predetermined threshold in the exposed portion of the detector. An image representative of the radiation is acquired and further analyzed to determine whether line artifacts exist. Data lines found to exhibit line artifacts are stored in the image processor.
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