Method for IC fault analysis using programmable built-in self test and optical emission
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United States of America Patent
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Sep 23, 2003
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N/A
app pub date -
Nov 1, 2000
filing date -
Nov 12, 1999
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Abstract
A method is provided for analyzing the functionality of an integrated circuit (IC). The method includes the step of applying a built-in self test (BIST) to the integrated circuit. The BIST includes a plurality of tests that result in the integrated circuit passing and/or failing with respect to predefined criteria. During the applying step, a substrate current of the integrated circuit is measured and analyzed as a function of at least one variable. Also during the applying step, optical emissions of the integrated circuit are measured and analyzed. Defects in the functionality of the integrated circuit are identified, based on at least one of the substrate current and the optical emissions.
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