Fast program to program verify method
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United States of America Patent
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Sep 30, 2003
Grant Date -
Jul 3, 2003
app pub date -
Feb 20, 2003
filing date -
Dec 15, 2000
priority date (Note) -
Expired
status (Latency Note)
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Abstract
In the present invention a new method for program and program verify is described. The threshold voltage of the memory cell is shifted up and then measured with minimal charging and discharging of the bit lines and control gate lines. Bit line to control gate line capacitance is also used to reduce the number of voltage references needed. Program current is reduced by use of a load device coupled to the source diffusion. The result is increased program bandwidth with lower high voltage charge pump current consumption.
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