Method and apparatus for testing for latch-up in integrated circuits
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United States of America Patent
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Oct 14, 2003
Grant Date -
N/A
app pub date -
Oct 24, 2000
filing date -
Oct 24, 2000
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A circuit is tested for latch-up by scanning an optical beam across the surface, supplying power to the integrated circuit, monitoring the power of the power supply, and detecting latch-up in the integrated circuit by capturing an image of the integrated circuit when the power reaches a predetermined threshold. The captured image is compared with a baseline image to determine where latch-up occurs in the circuit.
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