Automatic test equipment for testing a device under test
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United States of America Patent
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Oct 28, 2003
Grant Date -
Sep 12, 2002
app pub date -
Oct 31, 2001
filing date -
Mar 10, 2001
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An electronic circuit for automatic test equipment for testing a device under test includes two lines for connecting the circuit with a device under test. Two comparators are provided, one input of each of the comparators being connected to different ones of the two lines. A further comparator is provided, the two inputs of the further comparator being connected to different ones of the two lines. Each of the two lines is terminated. Switching elements are provided which are connected between the two lines. The switching elements enable the circuit to be used in different modes, in particular with a single-ended termination and with a differential termination.
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