Methods and apparatuses for multiple sampling and multiple pulse generation
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United States of America Patent
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Nov 4, 2003
Grant Date -
Mar 13, 2003
app pub date -
Aug 13, 2002
filing date -
Jun 6, 2001
priority date (Note) -
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Abstract
A method and apparatus for generating multiple ultra-fast (picosecond-range) electrical sampling apertures and pulses in response to a slewed control signal is disclosed. In one embodiment a series or sequence of sampling apertures are formed for sampling an input signal without the use of delay lines. In another embodiment, the input to be sampled is incrementally delayed to generate signals along a delay line. The delayed signals are simultaneously sampled in a sampling window to obtain a group of samples of an input signal at the same time. In another embodiment, a series or sequence of ultra-fast pulses are formed in an output signal without using delay lines. Parallel and serial sampler/pulser circuitry are disclosed.
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