Test needle for pattern adapter of circuit board tester
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United States of America Patent
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-
Nov 11, 2003
Issued Date -
N/A
app pub date -
Feb 21, 2002
filing date -
Aug 23, 1999
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
The test needle has, for contacting a circuit board test point, a contact portion configured conically tapered to a free contact tip. The contact portion has a length of at least 15 mm and at the contact tip a diameter smaller than 0.2 mm. An end section of the contact portion apposite the contact tip comprises a diameter at least 0.1 mm larger than the contact tip. With the test needle in accordance with the invention, extremely dense structures on circuit boards can be strobed. The test needle in accordance with the invention is stiffer than known test needles for strobing comparable structures. This simplifies their handling and the configuration of a pattern adapter incorporating these test needles.
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