Method and an arrangement for inspection of and measuring at an object
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United States of America Patent
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-
Nov 11, 2003
Grant Date -
N/A
app pub date -
May 3, 2002
filing date -
Aug 11, 1999
priority date (Note) -
In Force
status (Latency Note)
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Abstract
A method and an arrangement for inspection of a test object (1) for stains or pits at its surface and measuring of any stain or pit, where the test object is arranged in an inspection fixture (3) in at least one defied position. A monitoring device (7) and a scanning device (5) are arranged at the inspection fixture and a control unit (9) for controlling the inspection is included in the arrangement. The surface of the test object is monitored by means of the monitoring device (7) and an image, produced by the monitoring device is shown at the control unit. A stain or pit shown by the monitoring device is subsequently scanned by mean of the scanning device and the depth or width of the stain or pit is calculated, dependent of the results of the scanning device.
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