Method for generating expect data from a captured bit pattern, and memory device using same

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United States of America Patent

PATENT NO 6647523
APP PUB NO 20030088818A1
SERIAL NO

10268351

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Abstract

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Expect data signals are generated for a series of applied data signals having a known sequence to determine if groups of the applied data signals were properly captured. A first group of the applied data signals is captured, and a group of expect data signals are generated from the first group. A second group of the applied data signals is then captured and determined to have been properly captured when the second group corresponds to the group of expect data signals. In this way, when a captured series of data signals is shifted in time from an expected capture point, subsequent captured data signals are compared to their correct expected data signals to determine whether the group, although shifted in time, was nonetheless correctly captured. Expect data signals are generated in this manner and may be utilized in a variety of integrated circuits, such as an SLDRAM.

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Patent Owner(s)

Patent OwnerAddress
ROUND ROCK RESEARCH LLC26 DEER CREEK LANE MT KISCO NY 10549

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Manning, Troy A Meridian, ID 303 12693

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