Method and apparatus for temperature control of a device during testing
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United States of America Patent
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Nov 18, 2003
Grant Date -
Dec 12, 2002
app pub date -
Jul 19, 2002
filing date -
Oct 21, 1996
priority date (Note) -
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Abstract
A method for controlling the temperature of a DUT during a testing operation, includes a) measuring a parameter related to power consumption by the DUT during testing, such as current consumption; and b) using the parameter related to power consumption to operate a temperature control device to compensate for temperature change due to changes in power consumption by the DUT during testing. The control can be closed loop or open loop with control signals incorporated into a test program. Apparatus for controlling the temperature of a DUT during testing, includes a) a device for measuring a parameter related to power consumption by the DUT during testing; b) a temperature control device which operates to control the temperature of the DUT during test; and c) a device for controlling operation of the temperature control device according to the measured parameter related to power consumption.
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