Cleaning gas and method for cleaning vacuum treatment apparatus by flowing the cleaning gas

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United States of America Patent

PATENT NO 6659111
SERIAL NO

09480680

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Abstract

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A cleaning gas includes HF gas whose concentration is greater than or equal to 1 vol % and oxygen containing gas whose concentration ranges from 0.5 to 99 vol %. The oxygen containing gas includes at least one of O.sub.2 gas, O.sub.3 gas, N.sub.2 O gas, NO gas, CO gas and CO.sub.2 gas. The cleaning gas is employed to remove a deposited material generated in a vacuum treatment apparatus for producing a thin film of at least one of Ti, W, Ta, Ru, Ir, a compound thereof and an alloy thereof.

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Patent Owner(s)

Patent OwnerAddress
TOKYO ELECTRON LIMITED3-1 AKASAKA 5-CHOME MINATO-KU TOKYO 107-6325 107-6325
CENTRAL GLASS COMPANY LIMITED5253 OAZA OKIUBE UBE-SHI YAMAGUCHI 755-0001

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hatano, Tatsuo Yamanashi, JP 76 1649
Kawashima, Tadayuki Saitama, JP 6 300
Matsudo, Masahiko Yamanashi, JP 13 415
Mouri, Isamu Saitama, JP 5 277
Ohashi, Mitsuya Saitama, JP 11 287
Tamura, Tetsuya Saitama, JP 103 1210

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