Radiation inspection apparatus and radiation inspection method
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United States of America Patent
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Dec 9, 2003
Grant Date -
Oct 17, 2002
app pub date -
Apr 16, 2002
filing date -
Apr 17, 2001
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A radiation inspection apparatus is configured in such a way as to totalize pixels, whose gray levels represented by pixel gray level information, which is outputted from radiation detector, are within a preset gray level range of gray level profile from XL to XH, and to inspect from a result of the totalization whether or not a stockout of object occurs. Thus, the apparatus is enabled to correctly determine an occurrence of a stockout of the object by simple data processing without performing pattern recognition on a radiation perspective image.
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