System and method for self-referencing calibration
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United States of America Patent
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Dec 23, 2003
Grant Date -
Aug 15, 2002
app pub date -
Feb 5, 2002
filing date -
Feb 12, 2001
priority date (Note) -
In Force
status (Latency Note)
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Abstract
A method of calibrating a spectrographic inspection system, comprises providing a plurality of packages, each of the plurality of packages containing a group of items, wherein each of the groups of items has a known composition, measuring the reflectance value of each of the groups of items and thereby obtaining a reference reflectance value set, normalizing the reference reflectance value set and thereby creating a normalized reference reflectance value set, and storing the normalized reference reflectance value set.
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