Internal memory in application specific integrated circuit device and method for testing internal memory
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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Jan 6, 2004
Grant Date -
N/A
app pub date -
Apr 3, 2000
filing date -
Apr 3, 1999
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An internal memory in an ASIC device which is capable of allowing timing constraints to control signals in an asynchronous two-port RAM is disclosed. The present internal memory includes delays which synchronizes the timing of the read and write signals. Also, a method for easily and accurately testing a two-port RAM is disclosed, allowing a stable implementation of an internal memory in an ASIC device.
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