Low dielectric constant STI with SOI devices

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United States of America Patent

PATENT NO 6677209
APP PUB NO 20020094651A1
SERIAL NO

10099169

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Abstract

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Techniques of shallow trench isolation and devices produced therefrom are shown. The techniques of shallow trench isolation utilize foamed polymers, cured aerogels or air gaps as the insulation medium. Such techniques facilitate lower dielectric constants than the standard silicon dioxide due to the cells of gaseous components inherent in foamed polymers, cured aerogels or air gaps. Lower dielectric constants reduce capacitive coupling concerns and thus permit higher device density in an integrated circuit device. The shallow trench isolation structures are used on a variety of substrates including silicon-on-insulator (SOI) substrates and silicon-on-nothing (SON) substrates.

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Patent Owner(s)

Patent OwnerAddress
U S BANK NATIONAL ASSOCIATION AS COLLATERAL AGENT100 WALL STREET SUITE 1600 NEW YORK NY 10005

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Farrar, Paul A Okatie, SC 236 4342

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