Material segregation, density, and moisture analyzing apparatus and method
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United States of America Patent
Stats
-
Jan 13, 2004
Grant Date -
Dec 5, 2002
app pub date -
May 30, 2002
filing date -
May 23, 2001
priority date (Note) -
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status (Latency Note)
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Abstract
A material analyzing apparatus and associated method for analyzing. The apparatus comprises an analyzer body that contains a generally insulative material casing; a material analyzing circuitry that includes a transmitter, a receiver, and a control; an antenna system that includes a transmitting antenna, a receiving antenna, and a ground layer; a coupling structure that couples the antenna system to the material analyzing circuitry. The transmitter of the material analyzing circuitry generates a electromagnetic wave signal that is adapted to be sent by the transmitting antenna and directed into the material to be analyzed. The receiving antenna receiving any returned signal from the material and send the returned signal to the receiver and control. The control then analyzes the signal for material characteristics, including at least one of density, material segregation, and moisture.
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