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Abstract

A multipurpose configurable bus independent simulation bus functional model for testing a circuit is described. The multipurpose bus functional model utilizes a configurable data structure to interact with a device being tested by providing high-level test generation routines defined by the bus interface specified. The configurable data structure allows for verification of both signal timing and functional operation bus specifications. This data structure technique utilizes a standardized and parameterized method that allows variations and multiple instances of test bench models to be generated and instantiated in a design test environment. The bus functional model also sub-divides general functions and data structures into separate re-usable functional blocks. It is emphasized that this abstract is provided to comply with the rules requiring an abstract that will allow a searcher or other researcher to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims.

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