Semiconductor device

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United States of America Patent

PATENT NO 6678851
SERIAL NO

09637600

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Abstract

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A semiconductor device has a program storage unit and an A/D converter which converts an analog signal inputted from an analog to digital (A/D) conversion input terminal into a digital signal. The semiconductor device is provided with a withstand voltage anomaly test terminal and a selection unit which is; actuated by a program in the program storage unit that selects the A/D conversion input terminal at the time of normal operation; and selects the withstand voltage anomaly test terminal at the time of test operation. A potential signal of the withstand voltage anomaly test terminal at the time of test operation is detected as a digital value by the A/D converter based on the program in the program storage unit so that a judgment is made as normality or anomaly.

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Patent Owner(s)

  • MITSUBISHI ELECTRIC SYSTEM LSI DESIGN CORPORATION;RENESAS ELECTRONICS CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ootani, Naoki Hyogo, JP 6 47

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