Apparatus for and method of measuring capacitance with high accuracy
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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Jan 27, 2004
Grant Date -
Aug 1, 2002
app pub date -
Nov 2, 2001
filing date -
Nov 30, 2000
priority date (Note) -
Expired
status (Latency Note)
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Abstract
For measuring a capacitance with high accuracy, a capacitance measuring apparatus includes a voltage source with a current limiting function for applying different voltage values to the capacitance, and an integrator capable of continuous integrating operation for repeatedly integrating a current flowing through the capacitance at given periodic intervals. There is also disclosed a capacitance measuring method that is carried out by the capacitance measuring apparatus.
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