Sockets for testing electronic packages having contact probes with contact tips easily maintainable in optimum operational condition
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Feb 3, 2004
Grant Date -
Jul 3, 2003
app pub date -
May 17, 2002
filing date -
Dec 27, 2001
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An electrical socket (10) mounts a plurality of electrical contact probes (20, 22, 24, 26, 28, 30, 32) for providing an electrical connection between terminals of an electronic package (1,1') received in a seat (10d) formed in the socket and respective conductive pads of a DUT board. The contact probes each have a slidable contact tip (20m, 26m, 28m, 30m, 32m) which is adapted for engagement with a respective terminal of an electronic package received in the socket and which is removable from the contact probe for ease of replacement. The removable contact tips or plungers are provided with a retainer surface (20t, 28t, 30t, 32t) for interengagement with a removable retainer member of the socket.
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