Method and apparatus for testing an integrated circuit having an output-to-output relative signal
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United States of America Patent
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Feb 17, 2004
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N/A
app pub date -
Dec 23, 1999
filing date -
Dec 23, 1999
priority date (Note) -
Expired
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Abstract
An output-relative signal receiver to test an integrated circuit that provides an output-relative data signal. The output-relative signal receiver receives the output-relative data signal and a corresponding output strobe signal from an integrated circuit device and produces a test strobe signal derived from the output strobe signal. The test strobe signal is used to test a feature of the integrated circuit device indicated by the output-relative data signal.
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