Systems for detecting and measuring inclusions
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United States of America Patent
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-
Feb 17, 2004
Grant Date -
Nov 7, 2002
app pub date -
Mar 30, 2001
filing date -
Apr 2, 1999
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The present invention relates to systems of methods of detecting and measuring inclusions in liquid metals. More particularly, non-metallic inclusions having a conductivity level different from the liquid metal melt are forced to migrate and are collected on a measurement surface using electromagnetic Lorentz forces. The inclusions and their concentrations are detected at the measurement surface using either an electrostatic detection system or an optical detection system.
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