Method of repairing integrated circuits
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United States of America Patent
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Feb 24, 2004
Issued Date -
N/A
app pub date -
Jun 21, 2000
filing date -
Dec 22, 1997
priority date (Note) -
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status (Latency Note)
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Abstract
An arrangement and a method are provided for replacing defective units, which can be any desired unit of a chip (e.g., arithmetic and logic units), with a function unit. The arrangement and the method provide for performing self-tests more easily, less expensively and before or during a running of an application program. Fault tolerance is greatly enhanced during operation, which is advantageous for failure-critical applications such as in power plants, aviation, space travel or the military, for example.
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