Self-repairing semiconductor device having a testing unit for testing under various operating conditions
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United States of America Patent
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Apr 6, 2004
Grant Date -
N/A
app pub date -
Mar 17, 2000
filing date -
Mar 18, 1999
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A semiconductor device is provided having an internal circuit to be tested, a redundancy circuit used when detecting a defective part in the internal circuit, and a switching unit connected to the internal circuit and the redundancy circuit. The switching unit switches wiring in order to ensure proper operation of the semiconductor. A test unit is connected to the internal circuit for testing for the internal circuit. An operation environment change unit is connected to the internal circuit, wherein for changing an environment of the internal circuit when during testing. According to the present invention, testing of semiconductor devices can be performed under an actual environment so that a defective part can be detected under the actual operation environment. Moreover, it is possible to widen the range of guaranteed operation of semiconductor devices when a plurality of tests are performed under a plurality of operation environments.
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