Circuit board tester probe system
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United States of America Patent
Stats
-
Apr 13, 2004
Grant Date -
Aug 29, 2002
app pub date -
Apr 19, 2002
filing date -
Oct 26, 1999
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A probe for a circuit board tester as well as to an adapter and a circuit board tester. The probe comprises a needle and a sleeve, the needle being shiftingly guided in the sleeve and the needle protruding at least 10 mm from the sleeve, more particularly more than 20 mm. In one embodiment, the needle is conically tapered to a contact tip at least in a portion protruding from the sleeve. With the probe in accordance with the invention, adapters for circuit boards can be produced comprising contacts in high-density, the probes simultaneously acting resiliently.
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