Apparatus for and method of measuring thickness of materials using the focal length of a lensed fiber
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United States of America Patent
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Apr 13, 2004
Grant Date -
Feb 27, 2003
app pub date -
Feb 25, 2002
filing date -
Aug 23, 2001
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The present invention provides an apparatus for measuring the thickness of a material using the focal length of a lensed fiber and an associated method. The lensed fiber generates a Gaussian Beam and moves vertically with respect to the material. The strength of the beam reflected from the material is detected when the beam emitted from the lensed fiber is focused on the material. The thickness of the material is calculated based upon the detected strength of the reflected beam.
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