Integrated circuit having a self-test device for carrying out a self-test of the integrated circuit
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United States of America Patent
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Apr 27, 2004
Grant Date -
Aug 9, 2001
app pub date -
Jan 23, 2001
filing date -
Jul 23, 1998
priority date (Note) -
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status (Latency Note)
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Abstract
An integrated circuit includes a self-test device which is provided for executing a self-test of the integrated circuit and which has a control output. A program memory is connected to the self-test device for storing at least one test program supplied from outside the integrated circuit. The test program is run by the self-test device during execution of a self-test. The self-test device controls loading of a respective test program to be run into the program memory from outside the integrated circuit through the control output thereof.
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