IC with shared scan cells selectively connected in scan path
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United States of America Patent
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Apr 27, 2004
Grant Date -
Sep 27, 2001
app pub date -
Jan 10, 2001
filing date -
Jan 10, 2000
priority date (Note) -
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Abstract
This patent describes a boundary scan system where memories, i.e. flip flops or latches, used in data scan cells are also used functionally, but memories used in control scan cells are dedicated for test and not used functionally. The control scan cells can be scanned while the circuit is in functional mode, since their memories are dedicated. However, the data scan cells can only be scanned after the circuit transitions into test mode, since their memories are shared. This boundary scan system advantageously provides; (1) lower test circuitry overhead since the data scan cells use shared memories, (2) safe entry into test mode since the control scan cells can be scanned during functional mode to pre-load safe control conditions, and (3) avoidance of floating (i.e. 3-state) busses that can cause high current situations.
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