Redistribution of copper deposited films

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United States of America Patent

PATENT NO 6730605
APP PUB NO 20020148720A1
SERIAL NO

09833879

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Abstract

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A method to redistribute solid copper deposited by PVD on a wafer topography. The deposited copper is solubilized in a fluid for redistribution. The copper redistribution prevents inherent nonuniformity of the deposited copper film thickness by improving the uniformity of thickness of the copper film on the covered surfaces, such as vertical and bottom surfaces. The method provides the advantages of good adhesion and good grain growth and orientation that are achieved with copper deposited by PVD, and also provides the good step coverage as achieved with copper deposited by CVD.

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Patent Owner(s)

Patent OwnerAddress
TOKYO ELECTRON LIMITED3-1 AKASAKA 5-CHOME MINATO-KU TOKYO 1076325 ?1076325

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Arena-Foster, Chantal Mesa, AZ 2 23
Foster, Robert F Mesa, AZ 39 3153
Hillman, Joseph T Scottsdale, AZ 57 3918
Licata, Thomas J Mesa, AZ 15 493
Yasar, Tugrul Scottsdale, AZ 16 447

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