X-ray diffractometer
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United States of America Patent
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May 4, 2004
Issued Date -
N/A
app pub date -
Dec 13, 2001
filing date -
Dec 20, 2000
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An X-ray diffractometer has an X-ray source (10), a double pinhole collimator (14), a sample (22) mounted on a rotatable sample stage (20), an analyser crystal (30) and a detector (34). The analyser crystal and detector are arranged to rotate together about an axis (21) that is coaxial with the axis of rotation of the sample stage. Very few scattered X-rays (26) reach the detector (34). The diffractometer has particular use for routine quality control measurements.
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