Method and system for SMP profiling using synchronized or nonsynchronized metric variables with support across multiple systems
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United States of America Patent
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May 11, 2004
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N/A
app pub date -
Jul 6, 2000
filing date -
Jul 6, 2000
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Abstract
The value of non-discrete metric variables are synchronized at the processor level. When the profiler requests metric information for non-discrete metric variables, the operating system kernel obtains a global value for the requested metric rather than obtaining per-processor metric values for each processor. The global value may be written to trace records. By using a single global per-processor metric for all processors, a single global value of the last metric variable may be used for calculating the resources consumed on all processors since a last recorded event.
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