Method for synchronized delta-VBE measurement for calculating die temperature
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United States of America Patent
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May 18, 2004
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N/A
app pub date -
Feb 26, 2003
filing date -
Feb 26, 2003
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Abstract
A method for measuring a temperature of an integrated circuit is disclosed. The integrated circuit includes a temperature sensing element being excited by a first switched current and a second switched current. The method includes coupling a first capacitor to the temperature sensing element through a first switch and coupling a second capacitor to the temperature sensing element through a second switch. The first and second capacitors are external to the integrated circuit. The method further includes charging the first capacitor through the first switch to a first voltage when the temperature sensing element is being excited by the first switched current, charging the second capacitor through the second switch to a second voltage when the temperature sensing element is being excited by the second switched current, and measuring a difference between the first voltage and the second voltage to determine the temperature of the integrated circuit.
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