Crystal structure analysis method
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United States of America Patent
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May 18, 2004
Issued Date -
N/A
app pub date -
Mar 27, 2001
filing date -
Jul 17, 2000
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The invention provides a crystal structure analysis method so as to analyze crystal structures in detail. The inventive method comprises incrementing the tilting angle .psi. of the SBT thin film 1 by one degree in a range of 0 degree .ltoreq.y.ltoreq.90 degrees, for each of the increments of the tilting angle .psi. irradiating the X-ray onto the SBT thin film with the incident angle .theta. being incremented by 0.025 degrees in a range of 0 degree .ltoreq..theta..ltoreq.90 degrees and detecting the X-rays diffracted from the SBT thin film 1 by the detector 3.
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