Methods and apparatus for machine vision inspection using single and multiple templates or patterns
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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Jun 8, 2004
Grant Date -
N/A
app pub date -
Mar 24, 2000
filing date -
Mar 24, 2000
priority date (Note) -
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Abstract
A method for rapid determination of the position and/or orientation of a semiconductor device, electronic component or other object includes performing multiple times an operation of matching a pattern against an image. The matching operation finds the location, if any, of a respective pattern in the image and determines the degree of match. The position and orientation of the object is determined from the results of one of the matching operations, for example, from the operation that revealed the highest degree of match.
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