Apparatus for localizing production errors in a photovoltaic element
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United States of America Patent
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Jun 15, 2004
Grant Date -
N/A
app pub date -
Apr 1, 2002
filing date -
Oct 4, 1999
priority date (Note) -
Expired
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Abstract
Apparatus for localizing production errors in a photovoltaic element which is formed substantially by a semiconductor substrate in the form of a wafer, on opposite main surfaces of which are arranged electrical conductors for transporting electrical charge carriers. The apparatus includes at least one first electrode in electrical contact with a first main surface of the substrate and displaceable over the substrate, and a second electrode to be arranged in electrical contact with the conductors on the second main surface. A voltage measuring device is provided for measuring the voltage between the at least one first and the second electrode subject to the position of the first electrode on the first main surface, and a device for adjusting a bias over the electrical conductors on the opposite main surfaces of the substrate.
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