System and method for self-testing and repair of memory modules

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 6754117
APP PUB NO 20040034825A1
SERIAL NO

10222393

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Abstract

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A computer system and a method used to test and repair defective memory portions of memory devices located on a memory module. The computer system includes a memory hub controller coupled to a plurality of memory modules each of which includes a memory hub and a plurality of memory devices. The memory hub comprises a self-test module that determines the locations of defective memory locations of the memory devices. A repair module also included in the memory hub uses the locations of defective memory portions to create a remapping table. The remapping table redirects accesses to the defective locations of the memory devices to non-defective memory locations. Each time the memory hub receives a memory request from a memory access device, the memory hub checks the memory location to which the access is directed, and, if necessary, redirects the memory access to a non-defective location.

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Patent Owner(s)

Patent OwnerAddress
ROUND ROCK RESEARCH LLC26 DEER CREEK LANE MT KISCO NY 10549

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jeddeloh, Joseph M Shoreview, MN 199 6313

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