Method of and apparatus for testing CPU built-in RAM mixed LSI

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United States of America Patent

PATENT NO 6754849
APP PUB NO 20020129298A1
SERIAL NO

09904507

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Abstract

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A test apparatus includes a switch switched towards the ROM under the control of a signal output from the tester. When the switch is switched towards the ROM, the computer program for carrying out the self test is loaded in the main memory and the CPU performs the test using this computer program.

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Patent Owner(s)

Patent OwnerAddress
RENESAS ELECTRONICS CORPORATION2-24 TOYOSU 3-CHOME KOTO-KU TOKYO 135-0061

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Tamura, Hiroaki Tokyo, JP 55 460

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