Phenomenological orbital debris impact risk assessment model and software

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United States of America Patent

PATENT NO 6757612
SERIAL NO

10189381

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Abstract

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An orbital debris impact risk assessment and management model is provided for low-Earth orbit (LEO). The model is phenomenologically based, meaning real, theoretical and historical data of the LEO environment is used in conjunction with thermodynamic based code architecture to perform impact risk assessments. The format of the model is developed such that user friendliness and user adaptability are maximized. The model can be used as a stand-alone program (software) or run over the World-Wide Web as an application service provider (ASP). The model may be used to examine trends in the evolution of the LEO environment or to calculate likelihood of impacts for specific on-orbit assets or groups of assets.

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Patent Owner(s)

Patent OwnerAddress
OCEANIT LABORATORIES INC828 FORT ST MALL SUITE 600 HONOLULU HI 96813

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cheung, Ken C K Kailua, HI 10 568
Nishimoto, Daron L Kula, HI 2 9
Talent, David L Houston, TX 1 7

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