Matched set of integrated circuit chips selected from a multi wafer-interposer

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United States of America Patent

PATENT NO 6759741
APP PUB NO 20030129775A1
SERIAL NO

10371013

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A matched set of integrated circuit chips (34, 38) includes a chip (34) from a first wafer (22) and a chip (38) from a second wafer (24). The chips (34, 38) of the first and second wafers (22, 24) are tested together as part of a wafer-interposer assembly (10). The matched set comprises a first chip assembly diced from the wafer-interposer assembly (10) having one of the chips (34) from the first wafer (22) and a second chip assembly diced from the wafer-interposer assembly (10) having one of the chips (38) from the second wafer (24). A substrate is electrically coupled to the first and second chip assemblies, the first and second chip assemblies being selected for the matched set based upon sorting of the chips (34, 38) of the first and second wafers (22, 24) as a result of the testing.

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Patent Owner(s)

Patent OwnerAddress
TRANSPACIFIC MULTICAST LLC2711 CENTERVILLE ROAD SUITE 400 WILMINGTON DE 19808

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kline, Jerry D Argyle, TX 13 256

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