Low coherent reflectometer
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United States of America Patent
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Jul 6, 2004
Grant Date -
May 23, 2002
app pub date -
Oct 16, 2001
filing date -
Oct 18, 2000
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A low coherent reflectometer uses low coherent beams for measurement of refletance and refleting positions with respect to a measured optical circuit which includes a reflecting point. The low coherent beams are branched to produce measurement beams (DL) and local beams (KL), so that the measurement beams are introduced into a first optical path, which includes a dispersion shifted fiber, towards the measured optical circuit, while the local beams are introduced into a second optical path which includes a spatial optical path terminated by a reflecting mirror. Refleted measurement beams (RL) and reflected local beams are combined together to produce combined beams, which are subjected to processing and analysis.
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