Low coherent reflectometer

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United States of America Patent

PATENT NO 6760110
APP PUB NO 20020060794A1
SERIAL NO

09982557

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A low coherent reflectometer uses low coherent beams for measurement of refletance and refleting positions with respect to a measured optical circuit which includes a reflecting point. The low coherent beams are branched to produce measurement beams (DL) and local beams (KL), so that the measurement beams are introduced into a first optical path, which includes a dispersion shifted fiber, towards the measured optical circuit, while the local beams are introduced into a second optical path which includes a spatial optical path terminated by a reflecting mirror. Refleted measurement beams (RL) and reflected local beams are combined together to produce combined beams, which are subjected to processing and analysis.

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Patent Owner(s)

  • ANDO ELECTRIC CO., LTD.;NIPPON TELEGRAPH AND TELEPHONE CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Aoki, Syoichi Tokyo, JP 1 2
Senda, Kenji Tokyo, JP 61 460
Takada, Kazumasa Tokyo, JP 40 313
Yano, Tetsuo Tokyo, JP 29 191

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