Single point probe structure and method
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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Jul 27, 2004
Grant Date -
Apr 15, 2004
app pub date -
Oct 9, 2002
filing date -
Oct 9, 2002
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
One or more termination circuits or networks having compensation properties that are operative to reduce reflections occurring between a probe utilized by a test and measurement analyzer to test a device under test (DUT), such as an integrated circuit device, and the device under test itself are employed. The termination circuits are preferably small and less obtrusive than larger connectors and their compensation networking compensates for the connection of the probe to the DUT as well as connection of the cable from the probe to the analyzer performing the test and measurement function. The functionality of the termination circuits may be located at the DUT in a termination network connector or within the structure of the probe itself.
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