Method of electrically blowing fuses under control of an on-chip tester interface apparatus
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United States of America Patent
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Jul 27, 2004
Grant Date -
Apr 8, 2004
app pub date -
Oct 7, 2002
filing date -
Oct 7, 2002
priority date (Note) -
In Force
status (Latency Note)
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Abstract
A chip repair system designed for automated test equipment independent application on many unique very dense ASIC devices in a high turnover environment is disclosed. During test, the system will control on chip built-in self-test (BIST) engines collect and compress repair data, program fuses and finally decompress and reload the repair data for post fuse testing. In end use application this system decompresses and loads the repair data at power-up or at the request of the system.
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