Inspection method using penetrant and dielectrometer
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United States of America Patent
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Aug 24, 2004
Grant Date -
May 1, 2003
app pub date -
Aug 20, 2002
filing date -
Jan 6, 1997
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Described is an inspection method for detecting defects in dielectic test materials using a penetrant material and a dielectric sensor. The penetrant material provides differing dielectric properties from test material and improves the dielectric contrast between defects substantially filled by the penetrant and the test material. The penetrant can be a liquid, such as water, or a powder, as long as it provides a substantially different complex permittivity than the test material.
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