Differential coaxial contact array for high-density, high-speed signals
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United States of America Patent
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Aug 31, 2004
Grant Date -
Apr 1, 2004
app pub date -
Sep 30, 2002
filing date -
Sep 30, 2002
priority date (Note) -
In Force
status (Latency Note)
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Abstract
A probe tower for an automatic test system includes an insulative retainer for holding an array of differential probe assemblies. Each differential probe assembly is an elongated structure having first and second ends and first and second coaxial portions. Each coaxial portion includes an outer conductor and a pair of annular insulators positioned therein for holding a center conductor. First and second contact pins extend from the center conductor at the first and second ends, respectively. First and second ground pins, which are electrically connected to the outer conductors of the first and second coaxial portions, extend from the first and second ends for conveying ground connections.
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